Cypress
Semiconductor
Texas
2001-2008
Versatest Main Screen
The original Versatest 2100 main screen was revised so that the operators could view the test results per probecard site/needle underneath the wafer map.

Indicating die recovery for each probe card site enabled the operators to weigh the time to halt testing and repair the probe card, against allowing die retest to continue to take time to shift the probe card and retest die.